When measuring with light, the lateral extent of the structures that can be resolved by an optical imaging system is fundamentally diffraction limited. Overcoming this limitation is a topic of great interest in recent research, and several approaches have been published in this area.
When measuring with light, the lateral extent of the structures that can be resolved by an optical imaging system is fundamentally diffraction limited. Overcoming this limitation is a topic of great interest in recent research, and several approaches have been published in this area.
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